Test Integration Services, Inc

TIS

PRESIDENT

David Brannon is the President of Test Integrations Service, Inc. Founded in 1998 to provide the semiconductor industry with a variety of leading edge products used in the testing of wafers and packaged devices.
David started in the semiconductor industry in 1983 in Austin, TX. He was part of a family owned contract manufacturing business that provided custom product design, manufacturing and assembly. Product PCB's were thru-hole and SMT. Primary business was dedicated to Burn-in-Boards, Driver Boards and HAST Boards. David was responsible for all Sales, CAD designs, assembly and testing. In addition to servicing the Semiconductor industry, the consumer product market was serviced as well and included upcoming companies such as Dell Computers. IBM and many others.
In 1992, David became more invloved with the ATE industry when he moved to Phoenix, AZ.  As an ATE Board designer and later CAD Manager for a leading ATE product company, David became very familiar with a variety of tester loadbards, probe cards, contactors and probe tower products. David soon became a sales account mangager for all states East of CA, WA and OR.